Epigraphene on SiC

• Layer thickness from C:Si ratio Auger electron spectroscopy
• Layer thickness with Raman spectroscopy (substrate attenuation)
  
• Layer thickness via Raman Spectroscopy (G/2D intensity ratio)
• Average domain size with Raman spectroscopy
• Strain calculator with Raman Spectroscopy

Exfoliated or suspended graphene

• Layer thickness via optical microscopy (intensity contrast)
• Layer thickness via Raman Spectroscopy (G/2D intensity ratio)
  
• Average domain size with Raman spectroscopy
• Strain calculator with Raman Spectroscopy

Carbon nanotubes

• Diameter of SWCNT via Raman spectroscopy
  

• Film Resistivity (4 point probe)
• Overlayer film thickness and composition from Auger electron spectroscopy
• Inelastic mean free path calculator for electron spectroscopy
• Raman Spectroscopy semiconductor surface thermometer
  

Other

• Calculate rate of gas adsorption on crystal surfaces
• Measure interlayer distances from TEM diffraction pattern
• Energy conversion calculator
• Convert to the real heater temperature in LEED chamber (Internal use)
  

Utilities

• LaTex equation editor