Measure lattice constants from TEM diffraction patterns

A. In the reference diffraction pattern:

Lattice constant reference material = Å

Miller indices of the reference plane:

Measured reference distance R1 =
(relative to the diffraction spot of the corresponding reference plane)

B. In the unknown diffraction pattern:

Distance measured on the screen (R2) = mm

Miller indices of the plane under consideration:

If the camera length is known and reliable, an alternative method can be found here.