Measure lattice constants from TEM diffraction patterns
A.
In the reference diffraction pattern:
Lattice constant reference material =
Si
Å
Miller indices of the reference plane:
(200)
(111)
(022)
Measured reference distance R1 =
(relative to the diffraction spot of the corresponding reference plane)
B.
In the unknown diffraction pattern:
Distance measured on the screen (R2) =
mm
Miller indices of the plane under consideration:
(200)
(111)
(022)
If the camera length is known and reliable, an alternative method can be found
here
.
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